Consequences of Port Restrictions on Testing Address Decoder Faults in Two-Port Memories

نویسندگان

  • S. Hamdioui
  • A. J. van de Goor
چکیده

Testing two-port memories requires the use of single-port tests as well as special two-port tests; the test strategy determines which tests have to be used. Many two-port memories have ports which are read-only or write-only; this impacts the possible tests for single-port and two-port memories, as well as the test strategy. This paper discusses the consequences of the port restrictions (read-only or write-only ports) on the tests; in addition it covers the test strategy for address de-coder faults in two-port memories.

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تاریخ انتشار 1998